Integrated circuit electromagnetic susceptibility investigation, phase 3

Reported is the progress made in investigations of the susceptibility of semiconductor integrated circuits ICS to microwave energy. This report covers work performed in the first of three increments of the IC susceptibility task. The microwave effects on semiconductor integrated circuits have been studied, and susceptibility mechanisms for pn junctions and transistors have been identified. These effects are the basis for modeling the microwave effects in integrated circuits. Testing to provide data for the modeling has been performed. The susceptibility investigation for this increment centers on interference effects. Susceptibility reduction is being investigated through use of lossy ferrite materials and screening of devices to find the least susceptible ones. The dissemination and use of IC susceptibility information through the first draft of a handbook for system designers is also included.