Analysis technique for calibrating angular-measuring devices

The analytical process described allows the calibration of angular measuring devices to very high accuracy. Two devices are used, and the individual error curves are separated by the process. No prior knowledge of the error in either device is required and the devices may or may not be two identical devices. The types of devices which can be calibrated to high accuracies and the configuration for calibrating will be explored. The process has been used to calibrate an angular-positioning table and angle resolver to .1 arc second. A dual inductosyn system for axis angle read-out has also been calibrated. Data acquired from these calibrations is presented.