Analysis technique for calibrating angular-measuring devices

The analytical process described allows the calibration of angular measuring devices to very high accuracy. No prior knowledge of the error in the device is required and the devices may or may not be identical devices. The types of devices which can be calibrated to high accuracies and the configuration for calibrating is explored. The process was used to calibrate an angular-positioning table and angle resolver to 0.1 arc second. A dual inductosyn system for axis angle readout was also calibrated. Data acquired from these calibrations are presented.