Workshop on High Resolution Electron Microscopy
Abstract
The use of a high voltage high resolution electron microscope (500 kV, 1.7 A point-to-point) can give an improvement in resolution by a factor of two, relative to present instruments, for images which can be interpreted directly in terms of atom positions. This will take us past a critical barrier (2 A), the interatomic distance in solids. An increase by a factor of three or four in specimen thickness is possible for directly interpretable images compared to 100 kV instruments. The image contrast for individual atoms or atomic defects in crystals will be enhanced by a factor of two or three. This workshop report discusses the many facets of microscopy at atomic resolution including theory, instrumentation, many potential fields of application and the need for a National Facility to accomplish the goals.
- Publication:
-
Proc. held at Berkeley
- Pub Date:
- 1976
- Bibcode:
- 1976beca.proc...11.
- Keywords:
-
- Conferences;
- Electron Microscopes;
- Electron Microscopy;
- Imaging Techniques;
- Atomic Structure;
- Crystal Defects;
- High Resolution;
- Solid Surfaces;
- Technology Assessment;
- Atomic and Molecular Physics