Comparison of DPA results on electronic components
Abstract
The application of Destruct Physical Analysis (DPA) to diodes, transistors, and integrated circuits of the type currently used in aerospace equipment is discussed. Particular attention is given to the methods of evaluation and to the sample plans. The results, in terms of quantity accepted and rejected, are given for each method of procurement of parts for each type of part. The data presented may prove to be beneficial to both equipment manufacturers and customers for electronic hardware when deciding what type of parts program to specify during the design and development portions of a program.
- Publication:
-
Annual Reliability and Maintainability Symposium
- Pub Date:
- 1976
- Bibcode:
- 1976arm..symp..456P
- Keywords:
-
- Component Reliability;
- Destructive Tests;
- Electronic Equipment Tests;
- Failure Modes;
- Reliability Analysis;
- Reliability Engineering;
- Cost Effectiveness;
- Diodes;
- Integrated Circuits;
- Procurement;
- Transistors;
- User Requirements;
- Electronics and Electrical Engineering