Test Desk for reliability studies of electronic components
Abstract
A test desk was developed in order to study the relationship between 'life' and test failure rates, as well as other physico-technical characteristic values, such as nonlinearity of the characteristic curves, parameter drift or parameter distributions. The design followed general technical and testing requirements and provided for the following possibilities: use of the current level as a test parameter and use of voltage drop over the test piece as a test magnitude; realization of different current loads by variable test circuits, while the other tests conditions were maintained constant; performance of long term and short term tests, automation of error recognition, fault location and elimination, storing of the test results and automated test data output; and universal application both as regards the test pieces and also the insertion areas.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- August 1976
- Bibcode:
- 1976STIN...7814262P
- Keywords:
-
- Component Reliability;
- Electronic Equipment;
- Electronic Equipment Tests;
- Electrical Faults;
- Performance;
- Service Life;
- Electronics and Electrical Engineering