Fabrication and testing of MOS scaler/logic and overhead safety integrated circuit
Abstract
This report presents the results of the fabrication and test effort of a MOS/LSI integrated circuit used in the XM587E2/XM724 Electronic Time Fuze designed by Harry Diamond Laboratories (HDL). The integrated circuit performs the scaling and overhead safety functions of the fuze system. The device was designed and produced under contract DAAG39-74-C-0161. The MOS-LSI circuit was successfully fabricated and tested to all requirements of contract DAAG39-75-C-0146. One thousand first-article devices and six thousand production devices were successfully qualified and then shipped to HDL.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- May 1976
- Bibcode:
- 1976STIN...7728409D
- Keywords:
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- Electric Fuses;
- Integrated Circuits;
- Metal Oxide Semiconductors;
- Electronic Equipment Tests;
- Ordnance;
- Quality Control;
- Electronics and Electrical Engineering