Observations of the X-ray nova A 0620-00 with the Ariel V crystal spectrometer/polarimeter.

The X-ray nova A0620-00 has been studied with the Ariel V crystal spectrometer/polarimeter for the presence of X-ray lines and polarization. Upper limits are obtained for the Si XIV, S XV, and S XVI lines to a level of less than 2 eV at the 3-sigma level for the sulfur lines and 3.6 eV for Si XIV. No linear polarization is observed to a level of 2 per cent at 2.6 keV. These results are interpreted in terms of an accretion-disk model for the source in which the electron scattering depth is around 20. Constraints are given on the disk geometry.