Functionally integrated logic circuits with oxide insulation
Abstract
The paper describes the concept of Integrated Injection Logic (IIL) and the fabrication process of some IIL logic devices using oxide insulation developed from a process for Emitter Coupled Logic (ECL) high-speed logic circuits. Extension of the design flexibility and packing density of IIL circuits by exploiting the current hogging effect is pointed out. Switching times and their determination in IIL devices are briefly examined.
- Publication:
-
Kleinheubacher Berichte
- Pub Date:
- 1976
- Bibcode:
- 1976KlBer..19..161M
- Keywords:
-
- Bipolar Transistors;
- Functional Integration;
- Integrated Circuits;
- Logic Circuits;
- Semiconductor Devices;
- Transistor Logic;
- Emitters;
- Epitaxy;
- Equivalent Circuits;
- Fabrication;
- Gates (Circuits);
- Ion Implantation;
- Minority Carriers;
- Schottky Diodes;
- Electronics and Electrical Engineering