A model for burn-in programs for components with eliminateable defects
Abstract
The paper considers a component with a random number of defects which can be discovered and corrected during the course of a burn-in program. The failure rate after burn-in is constant (in time) and depends on the number of remaining defects. A sufficient condition is given for a burn-in program to lead to increased mean time to failure; it is given in terms of the prior distribution of the number of defects and the failure rates.
- Publication:
-
IEEE Transactions on Reliability
- Pub Date:
- October 1976
- Bibcode:
- 1976ITR....25..259D
- Keywords:
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- Component Reliability;
- Failure Modes;
- Mathematical Models;
- Reliability Analysis;
- Complex Systems;
- Electrical Faults;
- Laplace Transformation;
- Systems Analysis;
- Electronics and Electrical Engineering