Variations of quality and reliability values of electronic component parts in series production
Abstract
The article describes the statistical methods used in an analysis of data on the quality and reliability of semiconductor devices as accumulated at the users. The analysis stated facilitates stochastic models to be formed, pertaining to the variations of quality and reliability. It also points at the possibility to use modeling effectively for analyses of manufacturing methods dynamics and for obtaining higher accuracy in the calculation of anticipated reliability of systems manufactured and using these devices.
- Publication:
-
Slaboproudy Obzor
- Pub Date:
- April 1975
- Bibcode:
- 1975SlaOb..36..171K
- Keywords:
-
- Component Reliability;
- Electronic Equipment Tests;
- Quality Control;
- Reliability Analysis;
- Semiconductor Devices;
- Statistical Analysis;
- Electrical Faults;
- Mathematical Models;
- Production Engineering;
- Stochastic Processes;
- Electronics and Electrical Engineering