Theory and computing methods for stacked thin films
Abstract
A presentation is given of the mathematical formulation that enables to calculate, using the admittance method, the amplitudes and phases of transmitted absorbed and reflected electromagnetic radiation when normal or oblique incident radiation is in the presence of a stack of thin films with known thicknesses and optical constants. Computer programs derived from the formulae are given.
 Publication:

NASA STI/Recon Technical Report N
 Pub Date:
 December 1975
 Bibcode:
 1975STIN...7729367B
 Keywords:

 Computer Programs;
 Electrical Impedance;
 Electromagnetic Radiation;
 Mathematical Models;
 Thin Films;
 Analog Computers;
 Film Thickness;
 Incidence;
 Poynting Theorem;
 Superposition (Mathematics);
 Communications and Radar