A high sensitivity semiconductor strain sensitive circuit
Abstract
The application of the piezoresistive strain sensitivity of MOS transistors to a high sensitivity strain sensor is described. The basic physical mechanism involved is thought to be the variation of mobility of the charge carriers, which gives rise to a change in the gain factor, β, of the device. The non linear nature of the MOST is exploited in a 4 transistor bridge circuit configuration and a circuit using 2 transistors biassed with external constant current sources. Sensitivities up to 20 V/millistrain may be obtained with the supply voltage setting a limit to the dynamic range. The transducer circuit is limited by its drift performance and is better suited to sensing vibrations rather than steady strains.
- Publication:
-
Solid State Electronics
- Pub Date:
- April 1975
- DOI:
- 10.1016/0038-1101(75)90081-7
- Bibcode:
- 1975SSEle..18..295D
- Keywords:
-
- Metal Oxide Semiconductors;
- Piezoresistive Transducers;
- Semiconductor Devices;
- Strain Gages;
- Stress Measurement;
- Vibrational Stress;
- Electric Bridges;
- Nonlinear Systems;
- Sensitivity;
- Transistor Circuits;
- Electronics and Electrical Engineering