Methods of investigating the fine structure of alloys
Abstract
Methods of X-ray structural analysis and indirect, semidirect, and direct methods of electron microscopy are reviewed. It is shown that electron microscopy is highly sensitive to local changes in lattice orientations, but contrary to X-ray structural analysis does not reveal stresses of long-range order. Detailed information on fine structure can be obtained by using electron microscopy in combination with X-ray structural analysis.
- Publication:
-
Metallovedenie i Termicheskaia Obrabotka Metallov
- Pub Date:
- May 1975
- Bibcode:
- 1975MTObM..16...56F
- Keywords:
-
- Crystal Defects;
- Electron Microscopes;
- Lattice Parameters;
- Metal Crystals;
- Microstructure;
- X Ray Stress Analysis;
- Crystal Lattices;
- Crystallography;
- Fine Structure;
- Metallography;
- Stress Distribution;
- Instrumentation and Photography