Current noise and non-linearity in thin film resistors
Abstract
A preliminary investigation of the use of noise and nonlinearity measurements for evaluation of thin film resistors was conducted. Noise measurements seem to be of value only in special cases because of the low excess noise in thin film resistors. Nonlinearity is easily measured and conveniently expressed as third harmonic index (THI), which varies with length and width as predicted by theory. Measurements of resistors with different geometry and material can thus be compared. The variation of THI with temperature stress is complicated and not easily correlated with resistance drift and change in temperature coefficient.
- Publication:
-
In its Exptl. Work on Thin-Film Hybrid Circuits 39 p (SEE N76-12275 03-33
- Pub Date:
- June 1974
- Bibcode:
- 1974ewth.nasaQ....B
- Keywords:
-
- Nonlinearity;
- Resistors;
- Thin Films;
- White Noise;
- Component Reliability;
- Drift Rate;
- Electrical Resistivity;
- Failure Analysis;
- Harmonics;
- Service Life;
- Stability Tests;
- Temperature Effects;
- Thermal Noise;
- Electronics and Electrical Engineering