Temperature profiling by infrared microscope
Abstract
Profiling of the infrared radiative emission from an electronically charged material provides for a survey of temperature parameters and the detection of overloads and hot spots. Example measurements on an aluminum oxide thin film substrate are included.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- November 1974
- Bibcode:
- 1974STIN...7519633S
- Keywords:
-
- Electronic Equipment;
- Quality Control;
- Temperature Profiles;
- Thin Films;
- Aluminum Oxides;
- Infrared Radiation;
- Metal Films;
- Microscopes;
- Temperature Measurement;
- Instrumentation and Photography