Electrical conductivity and post-bombardment conductivity induced in MgO crystals by electron irradiation have been investigated following exposure to neutrons in the Brookhaven pile (integrated epi-cadmium fluxes of 4.2×1016 n/cm2 and 5.1×1017 n/cm2, respectively). A change in carrier lifetime was observed. No change in the temperature dependence of the yield was detected, indicating that the mobility of the charge carriers is unaffected by these irradiations. The 1.4-ev shallow trap previously observed was split into two levels by the neutron bombardment. This supports the association of this level with the 2.2-ev optical transition. Optical absorption measurements were conducted in the 0.6 to 3.0-ev range, and a previously unreported peak has been observed at 0.74 ev.