Ramped measurement technique for robust high-fidelity spin qubit readout

State preparation and measurement of single-electron spin qubits typically rely on spin-to-charge conversion where a spin-dependent charge transition of the electron is detected by a coupled charge sensor. For high-fidelity, fast readout, this process requires that the qubit energy is much larger than the temperature of the system limiting the temperature range for measurements. Here, we demonstrate an initialization and measurement technique that involves voltage ramps rather than static voltages allowing us to achieve state-to-charge readout fidelities above 99% for qubit energies almost half that required by traditional methods. This previously unidentified measurement technique is highly relevant for achieving high-fidelity electron spin readout at higher temperature operation and offers a number of pragmatic benefits compared to traditional energy-selective readout such as real-time dynamic feedback and minimal alignment procedures. Voltage ramps during measurement achieve high-fidelity electron spin qubit readout at high temperatures and low magnetic fields.