Dynamic conductance characteristics in HfOx-based resistive random access memory Chen, Ying-Chen ; Chang, Yao-Feng ; Wu, Xiaohan ; Zhou, Fei ; Guo, Meiqi ; Lin, Chih-Yang ; Hsieh, Cheng-Chih ; Fowler, Burt ; Chang, Ting-Chang ; Lee, Jack C. Abstract Publication: RSC Advances Pub Date: 2017 DOI: 10.1039/C7RA00567A Bibcode: 2017RSCAd...712984C