Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy
Abstract
The scanning tunnelling microscope can be used to image and manipulate individual defects in bulk insulating hexagonal boron nitride by capping the material with a monolayer of graphene.
- Publication:
-
Nature Nanotechnology
- Pub Date:
- November 2015
- DOI:
- arXiv:
- arXiv:1412.1878
- Bibcode:
- 2015NatNa..10..949W
- Keywords:
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- Condensed Matter - Mesoscale and Nanoscale Physics;
- Condensed Matter - Materials Science
- E-Print:
- 16 pages, 4 figures