Graphene Thickness Determination Using Reflection and Contrast Spectroscopy Ni, Z. H. ; Wang, H. M. ; Kasim, J. ; Fan, H. M. ; Yu, T. ; Wu, Y. H. ; Feng, Y. P. ; Shen, Z. X. Abstract Publication: Nano Letters Pub Date: September 2007 DOI: 10.1021/nl071254m Bibcode: 2007NanoL...7.2758N