Effect of a stochastic electron background on low-m tearing modes
Abstract
Available from http://journals.cambridge.org/bin/bladerunner?REQUNIQ=1105384964&REQSESS=958582&118000REQEVENT=&REQINT1=17997&REQAUTH=0
- Publication:
-
Journal of Plasma Physics
- Pub Date:
- February 1997
- DOI:
- 10.1017/S0022377896004655
- Bibcode:
- 1997JPlPh..57..247S