Definitive Molecular Level Characterization of Defects in UiO-66 Crystals Trickett, Christopher A. ; Gagnon, Kevin J. ; Lee, Seungkyu ; Gándara, Felipe ; Bürgi, Hans-Beat ; Yaghi, Omar M. Abstract Publication: Angewandte Chemie Pub Date: September 2015 DOI: 10.1002/ange.201505461 Bibcode: 2015AngCh.12711314T