Automated extraction of the short-range part of the interaction in non-contact atomic force microscopy
Abstract
A method for the automated extraction of the short-range part of the probe-surface interaction from force spectroscopy curves is presented. Our algorithm consists of two stages: the first stage determines a boundary that separates the region where the short-range interaction is dominantly acting on the probe and a second stage that finds the parameters to fit the interaction over the long-range region. We applied this method to force spectroscopy maps acquired over the Si ( 111 ) - ( 7 × 7 ) surface and found, as a result, a faint pattern on the short-range interaction for one of the probes used in the experiments, which would have probably been obviated using human-supervised fitting strategies.
- Publication:
-
Applied Physics Letters
- Pub Date:
- July 2020
- DOI:
- 10.1063/5.0007754
- arXiv:
- arXiv:2004.04882
- Bibcode:
- 2020ApPhL.117c3104D
- Keywords:
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- Condensed Matter - Mesoscale and Nanoscale Physics;
- Condensed Matter - Materials Science
- E-Print:
- doi:10.1063/5.0007754