Statistical model of passive tag for production processes automation RFID system parametric failures
Abstract
The main causes of the passive tag for manufacturing automation Radio Frequency Identification System (RFID) parametric failures by the criterion of the minimum range are considered. A mathematical model that allows estimating the yield of passive tags and the reliability during the assigned lifetime by the specified criterion has been developed.
- Publication:
-
Materials Science and Engineering Conference Series
- Pub Date:
- January 2020
- DOI:
- 10.1088/1757-899X/709/4/044048
- Bibcode:
- 2020MS&E..709d4048S