Radiation-Induced Variable Retention Time in Dynamic Random Access Memories Goiffon, Vincent ; Jay, Antoine ; Paillet, Philippe ; Bilba, Teddy ; Deladerriere, Theo ; Beaugendre, Guillaume ; Le Roch, Alexandre ; Dion, Arnaud ; Virmontois, Cedric ; Belloir, Jean-Marc ; Gaillardin, Marc Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: January 2020 DOI: 10.1109/TNS.2019.2956293 Bibcode: 2020ITNS...67..234G