Correlation between pit formation and phase separation in thick InGaN film on a Si substrate Woo, Hyeonseok ; Jo, Yongcheol ; Kim, Jongmin ; Cho, Sangeun ; Roh, Cheong Hyun ; Lee, Jun Ho ; Kim, Hyungsang ; Hahn, Cheol-Koo ; Im, Hyunsik Abstract Publication: Current Applied Physics Pub Date: December 2018 DOI: 10.1016/j.cap.2018.10.002 Bibcode: 2018CAP....18.1558W