A concise guide for the determination of less-studied technology-critical elements (Nb, Ta, Ga, In, Ge, Te) by inductively coupled plasma mass spectrometry in environmental samples
Abstract
There is an increasing demand for analytical techniques able to measure so-called 'technology-critical elements', a set of chemical elements increasingly used in technological applications, in environmental matrices. Nowadays, inductively coupled plasma-mass spectrometry (ICP-MS) has become the technique of choice for measuring trace element concentrations. However, its application is often less straightforward than often assumed. The hints and drawbacks of ICP-MS application to the measurement of a set of less-studied technology-critical elements (Nb, Ta, Ga, In, Ge and Te) is discussed here and concise guidelines given.
- Publication:
-
Spectrochimica Acta - Part B: Atomic Spectroscopy
- Pub Date:
- March 2018
- DOI:
- 10.1016/j.sab.2018.01.004
- Bibcode:
- 2018AcSpB.141...80F
- Keywords:
-
- ICP-MS;
- Technology-critical elements