Morphology of nanocermet thin films: X-ray scattering study
Abstract
The morphology of ceramic-metal (cermet) thin films is studied by surface-sensitive X-ray scattering techniques. Grazing incidence small angle X-ray scattering (GISAXS) experiments carried out at LURE with a 2D detector show that metal clusters of nanometer size, known as nanoparticles, are dispersed in the thin film. Analyses of the X-ray reflectivity along with the diffuse scattering allow to predict the formation of layers of nanoparticles along the growth direction of the films. The formation of such cumulative-disordered layers in one direction is likely to be related to the boundary condition in the reduced dimension.
- Publication:
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Physica B Condensed Matter
- Pub Date:
- June 2000
- DOI:
- 10.1016/S0921-4526(99)01899-2
- Bibcode:
- 2000PhyB..283...97H