Decaying Post-Flare Loops System Observed By SOHO/CDS And Yohkoh/SXT
Abstract
The results of an analysis of joint CDS of SOHO and SXT of Yohkoh observations of a decaying post-flare loop system are presented. The SXT images were used to explain some peculiar structural features visible in the examined CDS raster, resulting from the rapid evolution of the observed system and from the way the CDS rasters are built. The SXT data was also used to determine the time evolution of the temperature and the emission measure of the hot part of the system during its decay. The CDS data, with a very good temperature coverage, contains a density sensitive line pair of Fe XIV which was used for electron density analysis and a temperature sensitive line pair of Fe XVI and Si XII which was used to study the temperature structure of the loop system. From the integrated intensities of selected lines the emission measures were calculated. From these measurements we estimated the filling factor of the loop system in Fe XIV line.
- Publication:
-
8th SOHO Workshop: Plasma Dynamics and Diagnostics in the Solar Transition Region and Corona
- Pub Date:
- October 1999
- Bibcode:
- 1999ESASP.446..669V