Detection of parametric X-ray emission from a GaAs single crystal
Abstract
The paper reports the experimental observation of parametric X-ray emission (PXE) from a perfect GaAs single crystal at an angle of 90 deg to the electron-velocity direction. Measurements were performed on the Sirius synchrotron; the target was a 0.4-mm-thick GaAs single crystal in Bragg geometry. The PXE spectrum of GaAs was evaluated for an electron energy of 250 MeV in the case of diffraction on (400) planes. In addition, the energy dependence of the ratio of PXE intensity to the intensity of characteristic X-ray emission was examined in the 250-900 MeV range.
- Publication:
-
Pisma v Zhurnal Tekhnischeskoi Fiziki
- Pub Date:
- January 1988
- Bibcode:
- 1988PZhTF..14...57A
- Keywords:
-
- Crystal Optics;
- Electron Energy;
- Gallium Arsenides;
- Single Crystals;
- X Ray Sources;
- Electron Diffraction;
- Particle Motion;
- Solid-State Physics